Real-Time Embedded System Support for the BTeV Level 1 Muon Trigger

Document #:

BTeV-doc-1785-v1

Document type:

Talk

Submitted by:

M. Haney

Updated by:

M. Haney

Document Created:

20 May 2003, 13:50

Contents Revised:

20 May 2003, 13:50

DB Info Revised:

21 Mar 2005, 14:36

Abstract:

The Level 1 Muon Trigger subsystem for BTeV will be implemented using the same architectural building blocks as the BTeV Level 1 Pixel Trigger: pipelined field programmable gate arrays feeding a farm of dedicated processing elements. The muon trigger algorithm identifies candidate tracks, and is sensitive to the muon charge (sign); candidate dimuon events are identified by complementary charge track-pairs. To ensure that the trigger is operating effectively, the trigger development team is actively collaborating in an independent research program for reliable, self-aware, fault-adaptive behavior in real-time embedded systems (RTES). Key elements of the architecture, algorithm, performance, and engineered reliability are presented.

Files in Document:

• abstract and summary (Word) (nss2k3_ddb.doc, 29.5 kB)
• abstract and summary (pdf) (nss2k3_ddb.pdf, 9.2 kB)
• final paper (PDF) (nss_1745.pdf, 148.2 kB)
• final paper (Word format) (nss1745.doc, 48.0 kB)
• poster (PDF) (nss1745ppt.pdf, 347.1 kB)
• poster (PowerPoint) (nss1745.ppt, 184.0 kB)

Topics:

• Computing:RTES

Authors:

• BTeV RTES Group
• M. Haney

Keywords:

RTES Muon Trigger

Publication Information:

submitted to NSS 2003