Pixel Sensor Status

OCTOBER, 2003

Prototype sensors using p-stop isolation have been purchased and bench-tested before and after irradiation to 37 MRad (~1 x 10^15 MIPs). The first BTeV full-size, p-spray-isolation sensors have been received and bench-tested. This includes single-chip-size devices and various multi-chip-size devices (4, 5, 6, and 8 readout chips) for test. Beam tests to study charge collection and resolution before and after irradiation will be started when test beam is available at the Fermilab Meson Test Beam Facility where equipment is already installed.

We have also received p-spray sensors from the ATLAS collaboration. These have been bench tested before and after irradiation (up to 4x10**14 p/cm2). We also now have fifteen wafers using p-spray isolation and made to match the new FPIX2 chip. Bench tests show good yield, with leakage current and breakdown voltage meeting the BTeV performance specifications.

So far, it appears that both p-stop and p-spray sensors will operate at an acceptable level for ten years at design luminosity. Un-irradiated prototype devices achieved the required resolution in 1999 beam tests, and matched the expectations based on simulations. The plan is to test both p-stop and p-spray sensors in a test beam at Fermilab starting in the late fall of 2003.

APRIL, 2002

Prototype sensors using p-stop isolation have been purchased and bench-tested before and after irradiation to 37 MRad (~1 x 10^15 MIPs). The first BTeV full-size, p-spray-isolation sensors are being ordered. This order includes single-chip-size devices and various multi-chip-size devices (4, 5, 6, and 8 readout chips) for test. Plans are in place to follow up with full-size, p-stop-isolation sensors in the fall. Beam tests to study charge collection and resolution before and after irradiation will be started in the fall.

So far, it appears that the sensors will operate at an acceptable level for ten years at design luminosity. Un-irradiated prototype devices achieved the required resolution in 1999 beam tests, and matched the expectations based on simulations.

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